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Ships within 48 hours · Estimated delivery Aug 10 - Aug 15
Can be used for a wide range of nanotechnology
Standard Cu
PeakForce Tapping Hi-Res Probe B
detection of lateral nonlinearity
medium and high resolution gap tests are performed on the same specimen
NPV-10 Aluminum Can be used for aNPV 10 Silicon Nitride probe for general contact mode imaging and force measurements in air and liquid. 10 Pack DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS NPV 10 Silicon Nitride probe for general contact mode imaging and force measurements in air and liquid. 4 triangular silicon nitride cantilevers provide spring constants from 0. 06 to 0. 35 N m. 0. 06 to 0. 35 N m, 20nm tip radius, gold reflex coating 10 probes per pack Compatible with
